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detailed: This is a bright-field transmission electron microscopy (BF-TEM) high-resolution image showing Au nanoparticles dispersed on a Ge substrate. The objective of this analysis is to accurately segment and measure the size distribution of the Au particles, which are distributed across the Ge support. Understanding the size distribution of the Au particles is critical for evaluating the material's performance in applications such as catalysis and sensor technologies. This analysis will also provide insights into the uniformity and quality of the particle deposition process on the Ge substrate. |
