Daily Papers

Online hate speech is a recent problem in our society that is rising at a steady pace by leveraging the vulnerabilities of the corresponding regimes that characterise most social media platforms. This phenomenon is primarily fostered by offensive comments, either during user interaction or in the form of a posted multimedia context. Nowadays, giant corporations own platforms where millions of users log in every day, and protection from exposure to similar phenomena appears to be necessary in order to comply with the corresponding legislation and maintain a high level of service quality. A robust and reliable system for detecting and preventing the uploading of relevant content will have a significant impact on our digitally interconnected society. Several aspects of our daily lives are undeniably linked to our social profiles, making us vulnerable to abusive behaviours. As a result, the lack of accurate hate speech detection mechanisms would severely degrade the overall user experience, although its erroneous operation would pose many ethical concerns. In this paper, we present 'ETHOS', a textual dataset with two variants: binary and multi-label, based on YouTube and Reddit comments validated using the Figure-Eight crowdsourcing platform. Furthermore, we present the annotation protocol used to create this dataset: an active sampling procedure for balancing our data in relation to the various aspects defined. Our key assumption is that, even gaining a small amount of labelled data from such a time-consuming process, we can guarantee hate speech occurrences in the examined material.

As Neural Processing Units (NPU) or accelerators are increasingly deployed in a variety of applications including safety critical applications such as autonomous vehicle, and medical imaging, it is critical to understand the fault-tolerance nature of the NPUs. We present a reliability study of Arm's Ethos-U55, an important industrial-scale NPU being utilised in embedded and IoT applications. We perform large scale RTL-level fault injections to characterize Ethos-U55 against the Automotive Safety Integrity Level D (ASIL-D) resiliency standard commonly used for safety-critical applications such as autonomous vehicles. We show that, under soft errors, all four configurations of the NPU fall short of the required level of resiliency for a variety of neural networks running on the NPU. We show that it is possible to meet the ASIL-D level resiliency without resorting to conventional strategies like Dual Core Lock Step (DCLS) that has an area overhead of 100%. We achieve so through selective protection, where hardware structures are selectively protected (e.g., duplicated, hardened) based on their sensitivity to soft errors and their silicon areas. To identify the optimal configuration that minimizes the area overhead while meeting the ASIL-D standard, the main challenge is the large search space associated with the time-consuming RTL simulation. To address this challenge, we present a statistical analysis tool that is validated against Arm silicon and that allows us to quickly navigate hundreds of billions of fault sites without exhaustive RTL fault injections. We show that by carefully duplicating a small fraction of the functional blocks and hardening the Flops in other blocks meets the ASIL-D safety standard while introducing an area overhead of only 38%.